Two methods are available: 1. Use the new Convert Standalone Drawn Pads mode to convert drawn pads on a soldermask layer. This mode quickly finds all the standalone drawn pads and converts them to one of the following standard shapes: C, S, R, O, D, E or Q. Holes in C and S types are also recognized and automatically converted. Drawn pads with custom shapes can optionally be converted to M type D Codes. 2. The second method allows you to specify a guide layer to restrict the conversion. Typically, you would use a soldermask layer (perhaps the one converted using the stand alone method) as a guide layer. This mode is useful to convert drawn pads that are found on top or bottom component layers, containing both drawn pads to be converted and other trace features that should be ignored.

This new feature lets you compare two selections found on two different layers. The result of the operation is a new narrowed selection that depends upon the relative intersection of the elements found in each of the layers. The new selection appears on the destination layer and can contain one or more of the following: Any elements in the destination layer that are completely covered by elements in the reference layer Any elements in the destination layer that completely cover elements in the reference layer Elements in the destination layer that partially intersect elements in the reference layer Elements in the destination layer that are completely outside all elements in the reference layer.

• Run contour DRC now handles polygons (including malformed polygons). Previously, polygons were ignored.
• DRC errors can now be saved to a file or loaded from a file. This allows colleagues to review errors that you've found. Previously, DRC error info was lost when the job was closed.
• An "X marker" can now be superimposed over the display of all errors. This makes finding small feature errors easier.
• Gap errors can now be checked in elements that are part of the same net.

• Malformed polygons (those with intersecting edges or overlapping edges) can be converted to well formed ones.
• Chords To Arcs allows you to convert chords found in polygons to arcs.
• Arcs To Chords allows the conversion of arcs found in polygons to chords.
• Tools -> Compare Layers now handles polygons.

• Dimension text and arrows can now be added.
• Dimensioning can be restricted to be vertical or horizontal only or can optionally be allowed at any angle.

• The Insert menu (previously found as a submenu of Edit) has now been moved to a top level menu. Note that the "Insert" shortcut key is still functional.
• When inserting a trace-type (linear or arc) the outline of the shape being inserted now appears around the cursor as a guide to the user.

• File->Import->Mania DEF Added "Swap CMP/SOL" feature.
  Allows the component and solder sides to be swapped when read in.
• Import Mania Def Pads
  will now get their sizes from the probes to which they are mapped in the import file.
• Setup->Split Net->Keep all elements in the split job
  Now also works for splits that are offset and on the same fixture. This facilitates verification in verify.

ProbeMaster:

• MicroCraft tester
  output EMM format output uses 'M' to denote a pad with no test point instead of whether the pad is a midpoint.
• MicroCraft tester
  output Soldermask field output in the EMM format now reflects that of IPC-356A